Applied Science

Electron beam control in a scanning electron microscope (2014x8)

Udgivelsesdato: Apr 10, 2014

I describe electron beam optics and deflection as they are employed in scanning electron microscopy. http://web.jfet.org/vclk/ - Deflection amplifier http://www.johngineer.com/blog/?p=648 - CRT Christmas tree http://www.fei.com/ - FEI Company